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Lloyd’s Register (LR) has introduced significant enhancements to its Condition Assessment Program (CAP) Thickness Measurement Analysis process, designed to improve consistency, transparency and ...
During the manufacture of semiconductor wafers, thickness measurement forms an important part of this process, since it provides process engineers with the information required to ensure that ...
Optical coherence tomography can improve quality control and development of coated dosage forms by allowing film thickness to be measured in real time. The pharmaceutical coating process is a ...
HyperGauge In-plane Film Thickness Meter C17319-11 ©Hamamatsu Photonics Hamamatsu Photonics has developed the HyperGauge thickness measurement system C17319-11, a new device designed to enhance ...
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