When semiconductor devices had geometries of 0.18 microns and larger, most defects manifested themselves as static faults. Test strategies based on stuck-at fault-model scan patterns and standard ...
Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...
Overall scores in adaptive tests are influenced by accuracy from the very beginning.Clarity on concepts helps build speed, reduces errors, and en ...
The 2026 INDY NXT by Firestone season doesn’t start for another 3½ months, but teams, drivers and fans received a second sneak preview in the last two weeks after a test Nov. 10 at Barber Motorsports ...
As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
The top rungs of INDY NXT by Firestone are empty entering the 2026 season after 2025 champion Dennis Hauger and runner-up Caio Collet both landed rides in the NTT INDYCAR SERIES. But no clear favorite ...
Memory test at-speed isn't easy but can be achieved by balancing test selection, area overhead, and test-time constraints. The semiconductor industry has intensified its focus on yield issues to meet ...
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